Inkqubo yokubeka indawo ene-axis ezi-3 yokuhlolwa kwe-wafer kunye ne-metrology

Inkqubo yokubeka indawo ye-axis yokuhlolwa kwe-wafer kunye ne-metrology

Izisombululo zeDisplay yeFlat Panel ezenzelwe wena Isisombululo sethu kushishino lwe-FPD olufuna ukwenziwa siquka iinkqubo ukusuka kwi-AOI ukuya kwi-array tester phezu kwemilinganiselo ye-photo spacer. I-ZhongHui inokwenza isiseko segranite esichanekileyo senkqubo yokubeka ii-axis ezi-3 kunye nenkqubo yokubeka ii-axis ezininzi.

Wamkelekile ukuba unxibelelane nathi ukuze ufumane ulwazi oluthe kratya.


Ixesha lokuthumela: Disemba-31-2021