Imeko ye-metrology yemizi-mveliso kunye nohlalutyo lwesayensi itshintsha kakhulu. Njengoko ii-semiconductors zixinene ngakumbi kwaye isayensi yezinto ingena kummandla we-athomu, izixhobo ezisetyenziselwa ukuhlola olu phuculo kufuneka zihlangabezane nomgangatho ongazange ubonwe ngaphambili wokuzinza komzimba. Kuyilo lwentsebenzo ephezulu.Izixhobo zokuhlola umphezulukunye nezixhobo zohlalutyo ezintsonkothileyo, isiseko solwakhiwo asiseyonto icingelwayo—sisithintelo esiphambili ekusebenzeni. Kwi-ZHHIMG, sibonile ukuba utshintsho oluvela kwizakhelo zesinyithi zemveli ukuya kwizakhiwo zegranite ezidibeneyo yeyona nto ibalulekileyo kwii-OEM ezijolise ekufezekiseni ukuchaneka kwe-sub-micron kwiinxalenye zoomatshini zohlolo lwe-Automated Optical kunye neenkqubo zomfanekiso ezibuthathaka.
Ukuqhubela phambili ekuvelisweni kwezinto ezingenaziphene kwishishini le-elektroniki kubeke uxinzelelo olukhulu kwiinkqubo ze-Automated Optical Inspection (AOI). Ezi matshini kufuneka zicubungule amawaka ezinto ngomzuzu, kunye neekhamera ezinesisombululo esiphezulu ezihamba ngesantya esiphezulu kwaye zime ngoko nangoko ukuze zithathe imifanekiso. Le ndlela yokusebenza idala amandla abalulekileyo e-kinetic anokukhokelela kwi-resonance yesakhiwo. Ngokusebenzisa i-granite kwi-Automated Optical Inspection yokuqala, iinjineli zinokusebenzisa ubunzima bendalo kunye neempawu zokudambisa zangaphakathi. Ngokungafaniyo nentsimbi, enokungcangcazela kangangee-millisecond emva kokuma ngesantya esiphezulu, i-granite ifunxa ezi micro-oscillations phantse ngoko nangoko. Oku kuvumela ii-sensors ze-AOI ukuba zihlale ngokukhawuleza, zonyusa ngokuthe ngqo i-output kunye nokuthembeka kwenkqubo yokuhlola ngaphandle kokuphazamisa ukuchaneka.
Ngaphezu koko, njengoko singena kwicandelo lovavanyo olungonakalisiyo kunye nohlalutyo lwekristale, iimfuno ziya ziqina ngakumbi. Kwihlabathi lekristale,Isiseko somatshini wokusasaza i-X-raykufuneka inike ireferensi ephantse igqibelele. I-X-ray diffraction (XRD) ixhomekeke ekulinganisweni ngokuchanekileyo kwee-engile apho i-X-ray iphambukiswa khona sisampulu. Nokuba ukuphambuka kwemizuzwana embalwa ye-arc okubangelwa kukwanda kobushushu besiseko somatshini kunokwenza idatha ingabi namsebenzi. Yiyo kanye le nto i-aisiseko segranite se-X-ray diffractioniye yaba ngumgangatho weshishini wezixhobo ezikumgangatho webhubhoratri. I-coefficient ephantsi kakhulu yokwandiswa kobushushu begranite emnyama iqinisekisa ukuba ubudlelwane bendawo phakathi komthombo we-X-ray, isibambi sesampuli, kunye nesitshicileli buhlala buhleli, nokuba ubushushu obuveliswa zizixhobo ze-elektroniki okanye utshintsho lobushushu kwilebhu.
Ukusetyenziswa kwegranite kwizixhobo zokuhlola umphezulu kudlulela ngaphaya kokudambisa nje ukungcangcazela. Kwi-metrology yomphezulu yanamhlanje—apho iiprofayili ze-laser kunye nee-interferometers ezikhanyayo ezimhlophe zisetyenziselwa ukumakisha i-topography yee-silicon wafers okanye iilensi ze-optical—ukuthe tyaba komphezulu obhekisayo “ngumda wenyaniso.” Isiseko segranite se-ZHHIMG se-X-ray diffraction okanye i-surface scan sidityaniswe kwiingxaki ezigqithisileyo kangangokuba sibonelela “ngenqaku le-zero” elizinzileyo kuyo yonke i-envelope yomsebenzi. Oku kuthe tyaba okungokwemvelo kubalulekile kwizigaba zokuthwala umoya ezifumaneka rhoqo kwezi matshini. Uhlobo olungenamibhobho kunye nolufanayo lwegranite emnyama esemgangathweni ophezulu luvumela ifilimu yomoya ehambelanayo, evumela intshukumo engenamibhobho efunekayo kwiindawo zokuskena kwisikali se-nanometer.
Ngaphaya kokusebenza kobugcisa, ixesha elide legranite kwiindawo zoshishino libonelela ngenzuzo enkulu kwezoqoqosho kwiinkampani ze-OEM zaseYurophu naseMelika.Izixhobo zokuhlola umphezulu, ifreyimu yoomatshini idla ngokuba yeyona nto ingenakuphuculwa ngokulula. Ngelixa iikhamera, isoftware, kunye neesensa zitshintsha rhoqo emva kweminyaka embalwa, isiseko somatshini we-X-ray diffraction okanye i-AOI chassis kufuneka ihlale izinzile ngokwemilinganiselo iminyaka elishumi nangaphezulu. I-Granite ayigqwali, ayiphulukani noxinzelelo lwangaphakathi ngokuhamba kwexesha, kwaye iyamelana nomphunga weekhemikhali ohlala ufumaneka kwiindawo zokucoca ze-semiconductor. Oku kuqinisekisa ukuba utyalo-mali lokuqala kwizixhobo zoomatshini ze-Automated Optical Inspection ezikumgangatho ophezulu zihlawula izabelo ngendlela yokugcinwa okuncitshisiweyo kunye nokuzinza kokulinganisa ixesha elide.
Kwi-ZHHIMG, indlela yethu yokwenza ezi zinto zibalulekileyo idibanisa ukhetho lwezinto zendalo olungcono kunye nobunjineli obuphezulu bokuchaneka. Siyaqonda ukuba isiseko segranite se-X-ray diffraction singaphezulu nje kwelitye; yinxalenye yoomatshini elinganisiweyo. Inkqubo yethu ibandakanya ukuguga kwezinto eziqinileyo kunye nokutsalwa ngesandla ziingcali ezibalaseleyo ukuze zifikelele kwiinkcukacha zeBanga 00 okanye zeBanga 000. Ngokudibanisa izinto ezifakwe ngemisonto echanekileyo kunye neendlela zomdyarho wekhebula ezenziwe ngokwezifiso ngqo kwigranite, sinikezela ngesisombululo solwakhiwo "sokuplaga nokudlala" esivumela abavelisi bezixhobo ukuba bagxile kwizinto zabo eziphambili zokukhanya kunye nobuchwepheshe.
Ukuqukumbela, ikamva lokuhlolwa ngokuchanekileyo lakhelwe phezu kozinzo lwesiseko. Nokuba yindawo ekhawulezayo yomlilo yezixhobo zokuhlola umphezulu kumgca wemveliso okanye iimfuno ezizolileyo nezingqongqo zelebhu.Isiseko somatshini wokusasaza i-X-ray, i-granite iselukhetho olungenakuthelekiswa nanto. Ngokukhetha i-ZHHIMG njengeqabane lezixhobo zoomatshini ze-Automated Optical Inspection, abavelisi abakhethi nje umthengisi—baqinisekisa ukuthembeka kwesakhiwo okuya kuchaza isizukulwana esilandelayo sempumelelo yesayensi neyemizi-mveliso.
Ixesha leposi: Jan-15-2026