Kwimiba yeenkqubo ze-optical ezichanekileyo kakhulu—ukusuka kwizixhobo ze-lithography ukuya kwi-laser interferometers—ukuchaneka kokulungelelanisa kumisela ukusebenza kwenkqubo. Ukukhethwa kwezinto ze-substrate kumaqonga okulungelelanisa i-optical akukuphela nje kokukhetha ukufumaneka kodwa sisigqibo sobunjineli esibalulekileyo esichaphazela ukuchaneka kokulinganisa, ukuzinza kobushushu, kunye nokuthembeka kwexesha elide. Olu hlalutyo luhlola iinkcukacha ezintlanu ezibalulekileyo ezenza ii-substrates zeglasi ezichanekileyo zibe lukhetho olukhethwayo kwiinkqubo zokulungelelanisa i-optical, zixhaswa yidatha yobungakanani kunye neendlela ezilungileyo zoshishino.
Intshayelelo: Indima Ebalulekileyo Yezixhobo Ezingaphantsi Kwesitrato Kwindlela Yokulungelana Kwezinto Ezibonakalayo
Ingcaciso 1: Ukuhanjiswa kwe-Optical kunye nokusebenza kwe-Spectral
| Izinto eziphathekayo | Ukuhanjiswa Okubonakalayo (400-700 nm) | Uthumelo olukufutshane ne-IR (700-2500 nm) | Ubungakanani boburhabaxa bomphezulu |
|---|---|---|---|
| I-N-BK7 | >95% | >95% | I-Ra ≤ 0.5 nm |
| I-Silica edibeneyo | >95% | >95% | URa ≤ 0.3 nm |
| I-Borofloat®33 | ~92% | ~90% | I-Ra ≤ 1.0 nm |
| I-AF 32® eco | ~93% | >93% | I-Ra < 1.0 nm RMS |
| I-Zerodur® | Akukho (alubonakali kakuhle) | N / A | I-Ra ≤ 0.5 nm |
Umgangatho womphezulu kunye nokuSasazwa:
Ingcaciso 2: Ukuthe tyaba komphezulu kunye nokuzinza kobukhulu
| Inkcazelo yeFlatness | Iklasi yesicelo | Amatyala aqhelekileyo okusetyenziswa |
|---|---|---|
| ≥1λ | Ibanga lorhwebo | Ukukhanya ngokubanzi, ukulungelelaniswa okungabalulekanga |
| λ/4 | Inqanaba lokusebenza | Iileser zamandla aphantsi aphakathi, iinkqubo zokuthatha imifanekiso |
| ≤λ/10 | Ibanga lokuchaneka | Iileser ezinamandla aphezulu, iinkqubo zemetrology |
| ≤λ/20 | Ukuchaneka okukhulu | I-Interferometry, i-lithography, indibano ye-photonics |
Imingeni yoKwenziwa kweMveliso:
Ingcaciso 3: I-Coefficient of Thermal Expansion (CTE) kunye noZinzo loBushushu
| I-CTE (×10⁻⁶/K) | Utshintsho lweDimensional nge °C nganye | Utshintsho kwimilinganiselo nge-5°C Utshintsho |
|---|---|---|
| 23 (I-Aluminiyam) | 4.6 μm | 23 μm |
| 7.2 (Intsimbi) | 1.44 μm | 7.2 μm |
| 3.2 (AF 32® eco) | 0.64 μm | 3.2 μm |
| 0.05 (ULE®) | 0.01 μm | 0.05 μm |
| 0.007 (Zerodur®) | 0.0014 μm | 0.007 μm |
Iiklasi zezinto ezibonakalayo ngokwe-CTE:
- I-CTE: 0 ± 0.05 × 10⁻⁶/K (ULE) okanye 0 ± 0.007 × 10⁻⁶/K (Zerodur)
- Izicelo: I-interferometry echanekileyo kakhulu, iiteleskopu zesithuba, izibuko zereferensi ye-lithography
- Utshintshiselwano: Ixabiso eliphezulu, uthumelo oluncinci lwe-optical kwi-spectrum ebonakalayo
- Umzekelo: I-Hubble Space Telescope primary mirror substrate isebenzisa iglasi ye-ULE ene-CTE < 0.01 × 10⁻⁶/K
- I-CTE: 3.2 × 10⁻⁶/K (ifana kakhulu ne-3.4 × 10⁻⁶/K yesilicon)
- Izicelo: Ukupakisha kwe-MEMS, ukuhlanganiswa kwe-silicon photonics, uvavanyo lwe-semiconductor
- Inzuzo: Inciphisa uxinzelelo lobushushu kwiindawo ezidityanisiweyo
- Ukusebenza: Ivumela ukungalingani kwe-CTE ngaphantsi kwe-5% kunye ne-silicon substrates
- I-CTE: 7.1-8.2 × 10⁻⁶/K
- Izicelo: Ulungelelwaniso oluqhelekileyo lwe-optical, iimfuno zokuchaneka okuphakathi
- Inzuzo: Uthumelo olugqwesileyo lwe-optical, ixabiso eliphantsi
- Umda: Ifuna ulawulo lobushushu olusebenzayo kwizicelo ezichanekileyo
Ingcaciso 4: Iipropati zoomatshini kunye nokudambisa ukungcangcazela
| Izinto eziphathekayo | IModulus kaYoung (GPa) | Ukuqina Okuthile (E/ρ, 10⁶ m) |
|---|---|---|
| I-Silica edibeneyo | 72 | 32.6 |
| I-N-BK7 | 82 | 34.0 |
| I-AF 32® eco | 74.8 | 30.8 |
| I-Aluminiyam 6061 | 69 | 25.5 |
| Intsimbi (440C) | 200 | 25.1 |
Ukuqaphela: Nangona intsimbi inobunzima obuphezulu obupheleleyo, ubunzima bayo obuthile (umlinganiselo wokuqina ukuya kobunzima) bufana nobe-aluminium. Izinto zeglasi zibonelela ngobunzima obuthile obufana nobesinyithi kunye neenzuzo ezongezelelweyo: iipropati ezingezizo zemagnethi kunye nokungabikho kokulahleka kombane we-eddy.
- Ukuzahlula Ngokuphindaphindwayo: Kubonelelwa zi-pneumatic isolators ezine-resonant frequency 1-3 Hz
- Ukudambisa ubushushu obuphakathi: Kuthintelwa kukungqubana kwangaphakathi kwe-substrate kunye noyilo lwesakhiwo
- Ukucoca Ngokuphindaphindwayo: Kufezekiswa ngokulayisha ngobuninzi kunye nokungafani kwe-impedance
- Ubushushu obuqhelekileyo bokutsalela amanzi: 0.8 × Tg (ubushushu bokutshintsha kweglasi)
- Ubude bokutsalwa kwe-Annealing: iiyure ezi-4-8 ubukhulu obuyi-25 mm (izikali ezinobukhulu obuphindwe kabini)
- Izinga lokuphola: 1-5°C/iyure ukuya kwinqanaba lokuxinana
Ingcaciso 5: Uzinzo lweeKhemikhali kunye nokuxhathisa okusingqongileyo
| Uhlobo lokuxhathisa | Indlela yoVavanyo | Ulwahlulo | Umda |
|---|---|---|---|
| I-Hydrolytic | I-ISO 719 | Iklasi 1 | <10 μg Na₂O ilingana ngegram |
| I-asidi | I-ISO 1776 | Iklasi A1-A4 | Ukulahlekelwa bubunzima bomphezulu emva kokuvezwa yi-asidi |
| I-Alkali | I-ISO 695 | Iklasi 1-2 | Ukulahlekelwa bubunzima bomphezulu emva kokuvezwa kwi-alkali |
| Imozulu | Ukuvezwa ngaphandle | Igqwesile | Akukho kuhla okunokulinganiswa emva kweminyaka eli-10 |
Ukuhambelana kokucoca:
- I-Isopropyl alcohol (IPA)
- I-acetone
- Amanzi acocekileyo
- Izisombululo ezikhethekileyo zokucoca nge-optical
- I-silica exutyiweyo: < 10⁻¹⁰ I-Torr·L/s·cm²
- I-Borosilicate: < 10⁻⁹ I-Torr·L/s·cm²
- I-Aluminiyam: 10⁻⁸ – 10⁻⁷ I-Torr·L/s·cm²
- I-silica exutyiweyo: Akukho lahleko yokudluliselwa elinganisekayo ukuya kuthi ga kwi-10 krad iyonke idosi
- I-N-BK7: Ukulahleka kokudluliselwa kwe-transmission <1% kwi-400 nm emva kwe-1 krad
- I-silica exutyiweyo: Uzinzo lobukhulu < 1 nm ngonyaka phantsi kweemeko zelebhu eziqhelekileyo
- I-Zerodur®: Uzinzo lobukhulu < 0.1 nm ngonyaka (ngenxa yokuzinza kwesigaba sekristale)
- I-Aluminiyam: Ukushukuma kobukhulu be-10-100 nm ngonyaka ngenxa yokuphumla koxinzelelo kunye nokujikeleza kobushushu
Isakhelo soKhetho lwezinto: Ukufanisa iinkcukacha nezicelo
Ulungelelwaniso oluPhezulu kakhulu (ukuchaneka kwe-≤10 nm)
- Ubuthe tyaba: ≤ λ/20
- I-CTE: Phantse-zero (≤0.05 × 10⁻⁶/K)
- Uthumelo: >95%
- Ukudambisa ukungcangcazela: Ukungqubana kwangaphakathi kwe-High-Q
- I-ULE® (iKhowudi yeCorning 7972): Kwizicelo ezifuna ukuhanjiswa okubonakalayo/kwe-NIR
- I-Zerodur®: Kwizicelo apho ukuhanjiswa okubonakalayo kungadingeki
- I-Fused Silica (ekumgangatho ophezulu): Kwizicelo ezineemfuno eziphakathi zozinzo lobushushu
- Amanqanaba okulungelelanisa iLithography
- I-metrology ye-Interferometric
- Iinkqubo ze-optical ezisekelwe esibhakabhakeni
- Indibano ye-photonics echanekileyo
Ulungelelwaniso oluPhezulu (ukuchaneka kwe-10-100 nm)
- Ubuthe tyaba: λ/10 ukuya ku λ/20
- I-CTE: 0.5-5 × 10⁻⁶/K
- Uthumelo: >92%
- Ukumelana kakuhle kweekhemikhali
- I-Fused Silica: Ukusebenza kakuhle kakhulu xa iyonke
- I-Borofloat®33: Ukumelana kakuhle nobushushu, i-CTE ephakathi
- I-AF 32® eco: I-CTE ehambelana neSilicon yokudibanisa i-MEMS
- Ulungelelwaniso lomatshini we-laser
- Indibano ye-fiber optic
- Uhlolo lwe-semiconductor
- Uphando ngeenkqubo ze-optical
Ulungelelwaniso Oluchanekileyo Jikelele (ukuchaneka kwe-100-1000 nm)
- Ubuthe tyaba: λ/4 ukuya ku λ/10
- I-CTE: 3-10 × 10⁻⁶/K
- Uthumelo: >90%
- Isebenza kakuhle emalini
- I-N-BK7: Iglasi ekhanyayo eqhelekileyo, uthumelo olugqwesileyo
- I-Borofloat®33: Ukusebenza kakuhle kobushushu, ixabiso liphantsi kune-fused silica
- Iglasi yesoda-lime: Ixabiso layo liphantsi kakhulu kwizicelo ezingabalulekanga
- I-optics yezemfundo
- Iinkqubo zokulungelelanisa imboni
- Iimveliso ze-optical zabathengi
- Izixhobo zelebhu ngokubanzi
Izinto ekufuneka ziqwalaselwe kukwenziwa kwemveliso: Ukufezekisa iinkcukacha ezintlanu ezibalulekileyo
Iinkqubo zokugqiba umphezulu
- Ukusila Okurhabaxa: Kususa izinto ezinkulu, kufikelela ekunyamezeleni ubukhulu ± 0.05 mm
- Ukusila Okuncinci: Kunciphisa uburhabaxa bomphezulu ukuya kwi-Ra ≈ 0.1-0.5 μm
- Ukupholisha: Ifikelela ekugqibeleni komphezulu weRa ≤ 0.5 nm
- Ukuthamba okuhlala kuthe tyaba kuzo zonke ii-substrates ezingama-300-500 mm
- Ixesha lenkqubo elincitshisiweyo ngama-40-60%
- Ukwazi ukulungisa iimpazamo ze-mid-spatial frequency
- Ubushushu bokugquma: 0.8 × Tg (ubushushu bokutshintsha kweglasi)
- Ixesha lokumanzisa: iiyure ezi-4-8 (izikali ezinobukhulu obuphindwe kabini)
- Izinga lokuphola: 1-5°C/iyure ukuya kwindawo yokuxinana
Uqinisekiso loMgangatho kunye neMetrology
- I-Interferometry: I-Zygo, i-Veeco, okanye ii-interferometers ze-laser ezifanayo ezichanekileyo nge-λ/100
- Ubude bobude bomlinganiselo: Ngokwesiqhelo yi-632.8 nm (i-HeNe laser)
- Imbobo: Imbobo ecacileyo mayidlule kwi-85% yobubanzi be-substrate
- I-Atomic Force Microscopy (AFM): Ukuqinisekiswa kweRa ≤ 0.5 nm
- I-Interferometry yokukhanya okuMhlophe: Ukuze kube noburhabaxa 0.5-5 nm
- I-Contact Profilometry: Yokuba roughness > 5 nm
- I-Dilatometry: Kwimilinganiselo ye-CTE eqhelekileyo, ukuchaneka ±0.01 × 10⁻⁶/K
- Umlinganiselo we-CTE ophakathi kwe-interferometric: Kwizixhobo ze-CTE eziphantsi kakhulu, ukuchaneka ±0.001 × 10⁻⁶/K
- I-Fizeau interferometry: Yokulinganisa i-CTE homogeneity kuzo zonke ii-substrates ezinkulu
Izinto ekufuneka ziqwalaselwe xa kudityaniswa: Ukufaka iiGlasi ezingaphantsi kweGlasi kwiinkqubo zoLungelelaniso
Ukufakela kunye nokulungisa
- Izixhobo zokufaka iihoneycomb: Kwizinto ezinkulu nezikhaphukhaphu ezifuna ukuqina okuphezulu
- Ukubopha umphetho: Kwiindawo apho amacala omabini kufuneka ahlale efikeleleka khona
- Izixhobo zokubambelela ezibotshelelweyo: Ukusebenzisa izincamathelisi ezibonakalayo okanye ii-epoxies ezikhupha igesi kancinci
Ulawulo lobushushu
- Ukuchaneka koLawulo: ± 0.01°C kwiimfuno ze-λ/20 zokuthamba
- Ukufana: < 0.01°C/mm phezu komphezulu wesiseko
- Uzinzo: Ukushukuma kobushushu < 0.001°C/iyure ngexesha lemisebenzi ebalulekileyo
- Izikhuselo zobushushu: Izikhuselo zemitha ezininzi ezineengubo ezikhupha umbane omncinci
- Ubushushu: Izixhobo zobushushu ezisebenza kakuhle
- Ubunzima bobushushu: Ubunzima obukhulu bobushushu obuthintela ukuguquguquka kobushushu
Ulawulo lweNdalo
- Ukuveliswa kwamasuntswana: < 100 amasuntswana/ft³/min (Igumbi lokucoca leKlasi 100)
- Ukukhupha igesi: < 1 × 10⁻⁹ I-Torr·L/s·cm² (yezicelo ze-vacuum)
- Ukucoceka: Kufuneka imelane nokucocwa okuphindaphindiweyo kwe-IPA ngaphandle kokuwohloka
Uhlalutyo lweNzuzo yeendleko: Ii-substrates zeglasi ngokuchasene nezinye iindlela
Uthelekiso lweendleko zokuqala
| Izinto ezingaphantsi komhlaba | Ububanzi obuyi-200 mm, Ubukhulu obuyi-25 mm (USD) | Iindleko ezithelekisekayo |
|---|---|---|
| Iglasi yesoda-lika | $50-100 | 1 × |
| I-Borofloat®33 | $200-400 | 3-5× |
| I-N-BK7 | $300-600 | 5-8× |
| I-Silica edibeneyo | $800-1,500 | 10-20× |
| I-AF 32® eco | $500-900 | 8-12× |
| I-Zerodur® | $2,000-4,000 | 30-60× |
| I-ULE® | $3,000-6,000 | 50-100× |
Uhlalutyo lweendleko zomjikelo wobomi
- Izinto ezisetyenziswa kwiglasi: ubomi beminyaka emi-5 ukuya kweli-10, ulondolozo oluncinci
- Izinto ezisetyenziswa ngesinyithi: ubomi beminyaka emi-2-5, kufuneka ukuphinda ubekwe umphezulu rhoqo
- Izinto ezisetyenziswa kwiplastiki: Ubomi beenyanga ezi-6 ukuya kwezi-12, ukutshintshwa rhoqo
- Ii-substrates zeglasi: Vumela ukuchaneka kokulungelelanisa okungcono nge-2-10× kunezinye iindlela
- Izinto ezisetyenziswa ngesinyithi: Zincitshiswa kukuzinza kobushushu kunye nokuwohloka komphezulu
- Izinto ezisetyenziswa ngeplastiki: Zincitshiswe kukuqhekeka kunye nobuthathaka bendalo esingqongileyo
- Ukuhanjiswa okuphezulu kwe-optical: Imijikelo yokulungelelanisa ekhawulezayo eyi-3-5%
- Uzinzo olungcono lobushushu: Ukunciphisa imfuneko yokulinganisa ubushushu
- Ulondolozo oluphantsi: Ixesha elincinci lokungasebenzi ukuze kulungiswe kwakhona
Iindlela Zekamva: Iiteknoloji Zeglasi Ezivelayo Zokulungelelaniswa Kweembonakalo
Izinto zeGlasi ezenziwe ngobunjineli
- I-ULE® Elungiselelweyo: Ubushushu be-CTE obungenaziro bungachazwa ukuya kwi-±5°C
- Iiglasi zeGradient CTE: I-gradient ye-CTE eyenziwe ngobunjineli ukusuka kumphezulu ukuya embindini
- Utshintsho lwe-CTE yeSithili: Amaxabiso ahlukeneyo e-CTE kwimimandla eyahlukeneyo ye-substrate efanayo
- Ukuhlanganiswa kwe-Waveguide: Ukubhalwa ngokuthe ngqo kwe-waveguide kwi-substrate yeglasi
- Iiglasi ezixutyiweyo: Iiglasi ezixutyiweyo ze-Erbium okanye ezixutyiweyo zomhlaba ongaqhelekanga ukuze zisebenze kakuhle
- Iiglasi ezingezizo ezomgca: I-coefficient ephezulu engezizo ezomgca yokuguqula i-frequency
Iindlela zoPhuhliso eziPhambili
- Ijometri ezintsonkothileyo azinakwenzeka ngokwenziwa kwendabuko
- Iitshaneli zokupholisa ezidityanisiweyo zolawulo lobushushu
- Inkunkuma yezinto ezisetyenzisiweyo encitshisiweyo
- Ukubumba iglasi ngokuchanekileyo: Ukuchaneka kwe-sub-micron kwiindawo ezibonakalayo
- Ukuhla ngeemandrel: Fumana ukugoba okulawulwayo ngokugqiba umphezulu weRa < 0.5 nm
Ii-Smart Glass Substrates
- Izinzwa zobushushu: Ukubeka esweni ubushushu obusasazekileyo
- Iigeyiji zoxinzelelo: Umlinganiselo woxinzelelo/wokuguquka ngexesha langempela
- Izinzwa zesikhundla: I-metrology edibeneyo yokuzilinganisa
- Ukusebenza kobushushu: Izifudumezi ezidityanisiweyo zokulawula ubushushu obusebenzayo
- Ukusebenza kwePiezoelectric: Uhlengahlengiso lwendawo yesikali seNanometer
- I-Adaptive optics: Ukulungiswa komphezulu wento ngexesha langempela
Isiphelo: Iingenelo zoBuchule beZixhobo zeGlasi eziBalaseleyo
Isakhelo seSigqibo
- Ukuchaneka kokulungelelaniswa okufunekayo: Kuchonga ukuba i-flat kunye neemfuno ze-CTE
- Uluhlu lweWavelength: Izikhokelo zokudluliselwa kwe-optical
- Iimeko zeNdalo: Zichaphazela iimfuno ze-CTE kunye nozinzo lweekhemikhali
- Umthamo weMveliso: Ichaphazela uhlalutyo lweendleko-inzuzo
- Iimfuneko zoLawulo: Ingayalela izixhobo ezithile zokuqinisekiswa
Inzuzo ye-ZHHIMG
- Ukufikelela kwizixhobo zeglasi zexabiso eliphezulu ezivela kubavelisi abaphambili
- Iinkcukacha zezinto ezenziwe ngokwezifiso zezicelo ezizodwa
- Ulawulo lwekhonkco lokubonelela ngeenkonzo ukuze kubekho umgangatho ohambelanayo
- Izixhobo zokugaya nokupolisha ezikumgangatho ophezulu
- Ukupholisha okulawulwa yikhompyutha ukuze kube lula nge-λ/20
- I-metrology yangaphakathi yokuqinisekisa iinkcukacha
- Uyilo lwe-substrate lwezicelo ezithile
- Izisombululo zokufaka kunye nokulungisa
- Ukuhlanganiswa kolawulo lwe-thermal
- Uhlolo olupheleleyo kunye nesatifikethi
- Amaxwebhu okulandelela
- Ukuthobela imigangatho yoshishino (ISO, ASTM, MIL-SPEC)
Ixesha leposi: Matshi-17-2026
